WANG G, CHEN M R, LIU T F, et al ．Derivation of Barton standard JRC characterization formula considering sampling interval SI［J］. Journal of Henan Polytechnic University(Natural Science)， doi: 10.16186/j.cnki.1673-9787.2024030005.

doi: 10.16186/j.cnki.1673-9787.2024030005

Received： 2024-04-30

Revised： 2024-11-25

Online：2024-12-25

Derivation of Barton standard JRC characterization formula considering sampling interval SI (Online)

WANG Gang^1,2,CHEN Mingrui¹,LIU Tingfang^1,2,3,WANG Changsheng²,WU Xuezhen³,GUAN Hui⁴,CHEN Huiyuan⁵,Guan Shangshang⁶

1. Fujian University Key Laboratory of Underground Engineering, Fujian University of Science and Technology, Fuzhou, Fujian 350118, China; 2. Shandong Key Laboratory of Civil Engineering Disaster Prevention and Mitigation, Shandong University of Science and Technology, Qingdao, Shandong 266590, China; 3. College of Civil Engineering, Fuzhou University, Fuzhou, Fujian 350118, China; 4. Qingdao Institute of Surveying and Mapping, Qingdao, Shandong 266033, China; 5. Juxian Highway Development Center, Rizhao, Shandong 276599, China; 6. China Construction Eighth Bureau Testing Co. Ltd, Beijing 102488, China

Abstract: Objectives The accurate evaluation of structural plane topography is a prerequisite for the study of shear mechanical properties of jointed rock mass. In order to achieve accurate characterization of structural surface roughness, Methods This study uses the first-order derivative root mean square Z₂ to characterize the two-dimensional joint profile roughness (JRC^2D), and carries out graphic optimization and coordinate extraction of 10 Barton standard profiles combined with image refinement processing technology. Then the Z₂ values of each Barton standard JRC contour are calculated at different sampling intervals SI. After analyzing the influence rule of sampling interval SI on Z₂, the Z₂, SI and JRC values of each group of data were fitted and derived in exponential function form. Results The new JRC^2D representation formula suitable for sampling interval SI∈[0.1mm, 2.0mm] was finally obtained: JRC=(129.4163Z2e0.30102SI-17.1606)0.7782, SI∈[0.1mm and 2.0mm]. Conclusions Parameter JRC_P is introduced to verify the new formula. Comparing with the calculation results of previous JRC characterization formulas, it is shown that the JRC-Z₂ characterization formula considering sampling interval SI in this paper has high accuracy in its applicable range, and the research results can provide a theoretical basis for evaluating the structural surface roughness.

Key words: Barton standard JRC profile; image refinement processing; JRC characterization; first derivative root mean square Z₂; exponential fitting